The conference > Scientific program: Invited lectures

PLENARY SPEAKERS


Ian GILMORE
NPL, Teddington (UK)
Alfred Benninghoven Award

 Webpage - Abstract

"SIMS – All for one and one for all" 


Ron M.A. HEEREN
Univ. Maastricht (NL)
 

 Webpage - Abstract

"Mass spectrometry imaging and innovations in spatial biology"


 

KEYNOTE SPEAKERS

1 / Biomaterials, life science and biotechnology, tissue imaging


Felicia GREEN
Rosalind Franklin Institute, Osfordshire (UK)

 Webpage - Abstract


"New generation of microscopie mode Secondary Ion Mass Spectrometry imaging"


Anna KOTOWSKA
Univ. Nottingham (UK)

 Webpage - Abstract


"Unlocking the potential of high-volume SIMS data with molecular formula prediction"


Katie MOORE
Univ. Manchester (UK)

 Webpage - Abstract


Title to come


Peter SJOVALL
RISE Research Institutes of Sweden, Boras (SE)

Abstract


"ToF-SIMS analysis of biological and fossil samples"

 

 


 

2 / Analysis of complex samples, depth profiling and imaging


Manuela KILLIAN
Univ. Siegen (DE)

 Webpage - Abstract


"Digging into the depth of molecule coated oxide nanostructures - routes to analyse hybrid organic-inorganic nanomaterials"
 


Valentina SPAMPINATO
Univ. Catania (IT)

 Webpage - Abstract


"Advanced physico-chemical characterization of complex systems
for microelectronics: innovative SIMS-based approaches"

 



3 / Fundamental science


Michael ELLER
California State Univ. Northridge, CA (USA)
 

 Webpage - Abstract


"Nanoscale molecular analysis with nano-projectile SIMS"

4 / Geology, geo-and cosmochemistry, archaeology, environment


Caroline BOUVIER
Maastricht MultiModal Molecular Imaging Institute (M4i), Univ. Maastricht (NL)
Abstract


"ToF-SIMS imaging of heritage materials:
tackling analytical limitations to widen the interdisciplinary impact"


Christine JILLY-REHAK
Univ. Stanford (USA)

 Webpage - Abstract


"Utilizing dynamic SIMS for isotopic analysis of terrestrial and extraterrestrial materials"

 


Yeonhee LEE
Korea Institute of Science & Technology, Seoul (KR)

Abstract

"Characterization of asian lacquers from different vegetal origins using ToF-SIMS"

 

 

 

 


5 / High mass/spatial resolution analysis


Paweł MICHALOWSKI
Łukasiewicz – IMiF, Warsaw (PL)

 Webpage - Abstract


"From atomic layers, 3D nanostructures to full wafer
thickness – the versatility of the SIMS technique"

 


Naoya SAKAMOTO
Univ. Hokkaido, Sapporo (JP)

 Webpage - Abstract


"Stigmatic isotope imaging of solar system materials
using cryogenic LG-SIMS"



 


6 / Industrial applications (bio, organic, and inorganic)


Albert FAHEY
Corning Corp. (USA)

 Webpage - Abstract


Title to come

 


Claudia FLEISCHMANN
IMEC & Katholieke Univ. Leuven (BE)

 Webpage - Abstract


"How to leverage Atom Probe Tomography to address characterization
challenges in the semiconductor industry"


Marco HOPSTAKEN
IBM Research, New York (USA)

 Webpage - Abstract


Title to come


Masayuki OKAMOTO
Kao Corporation (JP)

Abstract


"ToF-SIMS applications for the development of household and personal care products"


Derk RADING
IONTOF Technologies GmbH, Münster (DE)

 Webpage - Abstract


"ToF-SIMS: instrument innovations and industrial applications"

 

 

 

 


 


7 / Machine learning, data analysis


Satoka AOYAGI
Seikei Univ., Tokyo (JP)

 Webpage - Abstract


"Data mining from rich SIMS data using machine learning"


Aditi BORKAR
Univ. Nottingham (UK)

 Webpage - Abstract


"Cryo-OrbiSIMS enables integrative modelling of RNA structures at atomic resolution"


Paul PIGRAM
La Trobe Univ., Melbourne (AU)

 Webpage - Abstract


"SIMS: transforming data complexity into a significant asset with machine learning"

 

 

 


 


 

8 / Instrumentation novel ion beams


9 / Correlative analysis or multi-technique approaches


Anton LEVLEV
CNMS, Oak Ridge National Lab. (USA)

 Webpage - Abstract


"Correlative studies of ion migration and chemical reactivity in electronic materials via combine AFM/ToF-SIMS platform"


Hélène ROGNIAUX
INRAE Nantes (FR)

 Webpage - Abstract


"Big pixels can be beautiful too... MALDI MSI sheds new light on plant cell walls"

 


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