Overview
Two Collections are planned in collaboration with the 24th International Conference on Secondary Ion Mass Spectrometry (SIMS-24). We actively encourage you to submit the material presented at SIMS-24 to one of these two collections. We also welcome research articles related to SIMS even if they are not presented at this conference.
Papers will be peer-reviewed and must meet JVST standards for both technical content and written English. All manuscripts will be evaluated according to the same standards as regular JVST submissions.