The conference > Scientific program: Invited lectures
Ian GILMORE
NPL, Teddington (UK)
Alfred Benninghoven Award
 Webpage -  Abstract
"SIMS – All for one and one for all"
Ron M.A. HEEREN
Univ. Maastricht (NL)
Webpage - Abstract
"Mass spectrometry imaging and innovations in spatial biology"
1 / Biomaterials, life science and biotechnology, tissue imaging
Felicia GREEN
Rosalind Franklin Institute, Osfordshire (UK)
Webpage - Abstract
"New generation of microscopie mode Secondary Ion Mass Spectrometry imaging"
Anna KOTOWSKA
Univ. Nottingham (UK)
Webpage - Abstract
"Unlocking the potential of high-volume SIMS data with molecular formula prediction"
Katie MOORE
Univ. Manchester (UK)
Webpage - Abstract
Title to come
Peter SJOVALL
RISE Research Institutes of Sweden, Boras (SE)
Abstract
"ToF-SIMS analysis of biological and fossil samples"
2 / Analysis of complex samples, depth profiling and imaging
Manuela KILLIAN
Univ. Siegen (DE)
Webpage - Abstract
"Digging into the depth of molecule coated oxide nanostructures - routes to analyse hybrid organic-inorganic nanomaterials"
Valentina SPAMPINATO
Univ. Catania (IT)
Webpage - Abstract
"Advanced physico-chemical characterization of complex systems
for microelectronics: innovative SIMS-based approaches"
Michael ELLER
California State Univ. Northridge, CA (USA)
Webpage - Abstract
"Nanoscale molecular analysis with nano-projectile SIMS"
4 / Geology, geo-and cosmochemistry, archaeology, environment
Caroline BOUVIER
Maastricht MultiModal Molecular Imaging Institute (M4i), Univ. Maastricht (NL)
Abstract
"ToF-SIMS imaging of heritage materials:
tackling analytical limitations to widen the interdisciplinary impact"
Christine JILLY-REHAK
Univ. Stanford (USA)
Webpage - Abstract
"Utilizing dynamic SIMS for isotopic analysis of terrestrial and extraterrestrial materials"
Yeonhee LEE
Korea Institute of Science & Technology, Seoul (KR)
Abstract
"Characterization of asian lacquers from different vegetal origins using ToF-SIMS"
5 / High mass/spatial resolution analysis
Paweł MICHALOWSKI
Łukasiewicz – IMiF, Warsaw (PL)
Webpage - Abstract
"From atomic layers, 3D nanostructures to full wafer
thickness – the versatility of the SIMS technique"
Naoya SAKAMOTO
Univ. Hokkaido, Sapporo (JP)
Webpage - Abstract
"Stigmatic isotope imaging of solar system materials
using cryogenic LG-SIMS"
6 / Industrial applications (bio, organic, and inorganic)
Albert FAHEY
Corning Corp. (USA)
Webpage - Abstract
Time-of-Flight Secondary Ion Mass Spectrometry of Inorganic Materials: Understanding and Quantification with more Information to Explore.
Claudia FLEISCHMANN
IMEC & Katholieke Univ. Leuven (BE)
Webpage - Abstract
"How to leverage Atom Probe Tomography to address characterization
challenges in the semiconductor industry"
Marco HOPSTAKEN
IBM Research, New York (USA)
Webpage - Abstract
Applications of SIMS in advanced nano-electronics R&D
Masayuki OKAMOTO
Kao Corporation (JP)
Abstract
"ToF-SIMS applications for the development of household and personal care products"
Derk RADING
IONTOF Technologies GmbH, Münster (DE)
Webpage - Abstract
"ToF-SIMS: instrument innovations and industrial applications"
7 / Machine learning, data analysis
Satoka AOYAGI
Seikei Univ., Tokyo (JP)
Webpage - Abstract
"Data mining from rich SIMS data using machine learning"
Aditi BORKAR
Univ. Nottingham (UK)
Webpage - Abstract
"Cryo-OrbiSIMS enables integrative modelling of RNA structures at atomic resolution"
Paul PIGRAM
La Trobe Univ., Melbourne (AU)
Webpage - Abstract
"SIMS: transforming data complexity into a significant asset with machine learning"
8 / Instrumentation novel ion beams
9 / Correlative analysis or multi-technique approaches
Anton LEVLEV
CNMS, Oak Ridge National Lab. (USA)
Webpage - Abstract
"Correlative studies of ion migration and chemical reactivity in electronic materials via combine AFM/ToF-SIMS platform"
Hélène ROGNIAUX
INRAE Nantes (FR)
Webpage - Abstract
"Big pixels can be beautiful too... MALDI MSI sheds new light on plant cell walls"
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