Correlative analysis or multitechnique analysis 2

10 September 2024
Conferences
CORR CORR 2 17:20 > 18:40 Correlative analysis or multitechnique analysis 2 Room Hermione CORR

17:20 CORR2-O1-189 Surface Analysis of Nanolayers by LEIS, SIMS and XPS > B. Birgit HAGENHOFF (Muenster) 17:40 CORR2-O2-027 ToF-SIMS and XPS coupled characterization of HgCdTe surface oxides for infrared detection applications > S. Steven Bel (Grenoble) 18:00 CORR2-O3-029 Correlated microscope/ToF-SIMS imaging mass spectrometry with continuous C60 ion beam > H. Haiyang Li (Dalian) 18:20 CORR2-O4-079 Way to understand the functional thin films formation in static and dynamic conditions and its co-dependency with topography – Poly(4-vinylpyridine)-CoBr2 complex case study > J. Julia CHUDZIK (Kraków)

 


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