Correlative analysis or multitechnique analysis 2
10 September 2024
Conferences
CORR
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CORR 2
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17:20
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18:40
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Correlative analysis or multitechnique analysis 2
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Room Hermione
CORR
17:20
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CORR2-O1-189
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Surface Analysis of Nanolayers by LEIS, SIMS and XPS
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B.
Birgit
HAGENHOFF (Muenster)
17:40
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CORR2-O2-027
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ToF-SIMS and XPS coupled characterization of HgCdTe surface oxides for infrared detection applications
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S.
Steven
Bel (Grenoble)
18:00
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CORR2-O3-029
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Correlated microscope/ToF-SIMS imaging mass spectrometry with continuous C60 ion beam
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H.
Haiyang
Li (Dalian)
18:20
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CORR2-O4-079
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Way to understand the functional thin films formation in static and dynamic conditions and its co-dependency with topography – Poly(4-vinylpyridine)-CoBr2 complex case study
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J.
Julia
CHUDZIK (Kraków)
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