Analysis of complex samples, depth profiling and imaging 4
12 September 2024
Conferences
COMP
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COMP 4
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15:20
>
16:40
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Analysis of complex samples, depth profiling and imaging 4
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Auditorium Crépeau
COMP
15:20
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COMP4-O1-018
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Novel Strategies for the characterization of the battery materials by ToF-SIMS: from an in-situ exploration to an operando measurement
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T.
Tanguy
TERLIER (Houston)
15:40
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COMP4-O2-134
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3D ToF-SIMS imaging of polyethylene oxide-lithium nitrate electrolytes in Lithium-ion batteries
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L.
Luke
HANLEY (Chicago)
16:00
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COMP4-O3-045
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ToF-SIMS to discover multielement two dimensional materials
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C.
Chunli
DAI (Shenyang)
16:20
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COMP4-O4-124
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Surface analysis of TiO2 nanoparticles using ToF-SIMS: The influence of sample preparation methods, studied in a VAMAS interlaboratory comparison
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F.
Francesca
BENNET (Berlin),
J-P.
Jean-Paul
BARNES (Grenoble)
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