Analysis of complex samples, depth profiling and imaging 4

12 September 2024
Conferences
COMP COMP 4 15:20 > 16:40 Analysis of complex samples, depth profiling and imaging 4 Auditorium Crépeau COMP

15:20 COMP4-O1-018 Novel Strategies for the characterization of the battery materials by ToF-SIMS: from an in-situ exploration to an operando measurement > T. Tanguy TERLIER (Houston) 15:40 COMP4-O2-134 3D ToF-SIMS imaging of polyethylene oxide-lithium nitrate electrolytes in Lithium-ion batteries > L. Luke HANLEY (Chicago) 16:00 COMP4-O3-045 ToF-SIMS to discover multielement two dimensional materials > C. Chunli DAI (Shenyang) 16:20 COMP4-O4-124 Surface analysis of TiO2 nanoparticles using ToF-SIMS: The influence of sample preparation methods, studied in a VAMAS interlaboratory comparison > F. Francesca BENNET (Berlin), J-P. Jean-Paul BARNES (Grenoble)

 


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