Analysis of complex samples, depth profiling and imaging 5
12 September 2024
Conferences, Oral
COMP
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COMP 5
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17:20
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18:40
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Analysis of complex samples, depth profiling and imaging 5
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Auditorium Crépeau
COMP
17:20
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COMP5-O1-108
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Channeling proton implantation in 4H-SiC: coupling dynamic SIMS with DLTS defect profiling
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O.
Orazio
Samperi (Catania)
17:40
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COMP5-O2-030
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Advancing photocatalytic hydrogen production: the critical role of ToF-SIMS in the detection of single-atom catalysts on TiO2 nanotubes
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S.
Setareh
ORANGPOUR (Siegen)
18:00
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COMP5-O3-159
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Investigation of signal loss as a consequence of analysis under high vacuum conditions
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M.
Matija
LAGATOR (Didcot)
18:20
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COMP5-O4-097
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The use of Time-Of-Flight Secondary Ion Mass Spectrometry to characterize ZnO@SiO2 nanofertilizer translocation in tomato plants following foliar application
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S.
Subhasis
GHOSHAL (Montreal)
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