Analysis of complex samples, depth profiling and imaging 5

12 September 2024
Conferences, Oral
COMP COMP 5 17:20 > 18:40 Analysis of complex samples, depth profiling and imaging 5 Auditorium Crépeau COMP

17:20 COMP5-O1-108 Channeling proton implantation in 4H-SiC: coupling dynamic SIMS with DLTS defect profiling > O. Orazio Samperi (Catania) 17:40 COMP5-O2-030 Advancing photocatalytic hydrogen production: the critical role of ToF-SIMS in the detection of single-atom catalysts on TiO2 nanotubes > S. Setareh ORANGPOUR (Siegen) 18:00 COMP5-O3-159 Investigation of signal loss as a consequence of analysis under high vacuum conditions > M. Matija LAGATOR (Didcot) 18:20 COMP5-O4-097 The use of Time-Of-Flight Secondary Ion Mass Spectrometry to characterize ZnO@SiO2 nanofertilizer translocation in tomato plants following foliar application > S. Subhasis GHOSHAL (Montreal)

 


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