Analysis of complex samples, depth profiling and imaging 6
13 September 2024
Conferences
COMP
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COMP 6
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08:30
>
10:10
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Analysis of complex samples, depth profiling and imaging 6
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Auditorium Crépeau
COMP
08:30
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COMP6-KN
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ToF-SIMS study of the electrochemical isotope effects for the lithium-ion batteries
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Y.
Yao
ZHAO (Beijing)
09:10
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COMP6-O1-235
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In situ ToF-SIMS analysis of solid-liquid interfaces
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F.
Fuyi
WANG (Beijing)
09:30
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COMP6-O2-054
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Improvements in ToF-SIMS depth profiling and quantification of metals in alloys by H2 and O2 flooding
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J.
Jernej
EKAR (Ljubljana)
09:50
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COMP6-O3-232
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SIMS analysis of transmuted nuclides in neutron-fluence detectors
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J.
Jan
LORINCIK (Husinec)
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