Poster session 1

• BIO-P1-008 • SIMS 7F: Enhance nuclear safety with insigths into processes and origins > D. David SUHARD (Fontenay Aux Roses) • BIO-P1-015 • Molecule prediction in ToF-SIMS spectra for peptide and lipid mixture samples using machine learning > M. Mine IWAHORI (Tokyo) • BIO-P1-056 • Localization and impact of perfluorooctanoic acid (PFOA) in vitro and in vivo by multimodal imaging > J-N. Jean-Nicolas AUDINOT (Esch Sur Alzette) • BIO-P1-110 • High-throughput quantitative analysis of amino acids in freeze-dried drops using Time-of-Flight Secondary Ion Mass Spectrometry > H. Heejin LIM (Cheongju) • BIO-P1-152 • Measurement of metabolite and lipid changes in a 6-hydroxydopamine-induced Parkinson’s disease mouse model using mass spectrometery > H. Hyun Kyong SHON (Daejeon) • BIO-P1-168 • 2D TMD-based LDI-ToF studies for therapeutic drug monitoring of human blood samples > T. Tae Geol LEE (Daejeon) • BIO-P1-174 • Time-of-Flight Secondary Ion Mass Spectrometry for analyzing interactions between oral care products and dental hard tissues > N. Nicole MICHLER (Halle /Saale) • BIO-P1-205 • Analyte migration in ME-SIMS imaging > T. Thorsten ADOLPHS (Münster) • BIO-P1-267 • Characterization of cellular pigment composition in chameleon chromatophors by ToF-SIMS imaging > T. Tingting FU (Geneva) • BIO-P1-269 • Investigating the effects of X-ray irradiation on membrane lipids in breast cancer cells using ToF-SIMS > C. Charlotte ROSSI (Namur) • BIO-P1-272 • ToF-SIMS investigation of the link between spatial oligodendrocytes lineage heterogeneity and myelin sheath lipid composition > A. Antoine SMITS (Namur) • COMP-P1-073 • ToF-SIMS analysis of transition metal oxide surfaces hosting 2D electron gases > A. Andrea Marina LUCERO MANZANO (Bariloche, Rio Negro) • COMP-P1-092 • ToF-SIMS investigation of nanostructured TiO2‑based Films for enhanced environmental remediation > E. Enrica Maria MALANNATA (Catania) • COMP-P1-096 • OrbitrapTM-SIMS to improve the accuracy of the As quantification in SiGe > A. Alexis FRANQUET (Leuven) • COMP-P1-115 • ToF-SIMS study on the SEI formation on hard carbon electrodes in sodium ion batteries > D. David SCHÄFER (Giessen) • COMP-P1-129 • Functional bevels created in ToF-SIMS for in situ cross-section characterisation of solid-electrolytes > S. Sivakkumaran SUKUMARAN (London) • COMP-P1-144 • Characterization of ion-implanted 4H-SiC for dopant analysis in SiC power semiconductors > T. Tae Eun HONG (Busan) • COMP-P1-184 • Molecular and structural characterisation of individual lipid nanoparticles using 3D ToF-SIMS and TEM under cryogenic conditions > P. Peter SJÖVALL (Boras) • COMP-P1-195 • Preparation and characterization of sodiated non-graphitic hard carbon anodes for sodium-ion batteries by ToF-SIMS > P. Pascal DIPPELL (Gießen) • COMP-P1-215 • ToF-SIMS analysis of Au/Ge/Ni ohmic contacts for n GaAs > A. Andrea Marina LUCERO MANZANO (Bariloche, Rio Negro) • COMP-P1-246 • Characterization of passivation layers on graphite and NMC electrodes: insights from SIMS and HAXPES analysis > A. Abdulrhman ALSAEDI (Manchester) • COMP-P1-257 • Ionic liquid based electroplating as an alternative to traditional deposition chemistries > C. Cameron LONGO (Watervliet) • COMP-P1-264 • Chemical and Electrical characterization of Mg-Doped GaN > S. Silvia VANGELISTA (Agrate B.Za) • CORR-P1-025 • Design method and construction of the Schwarzschild microscope with high numerical aperture for Secondary Ion Mass Spectrometry > Y. Yi CHEN (Dalian) • CORR-P1-052 • Practical and easy-to-access tools for SIMS image data processing and correlative analysis > P. Pablo Maria DELFINO (Esch Sur Alzette) • CORR-P1-060 • In-situ ToF-SIMS investigation of battery cells to unveil electrochemical reactions > T. Timo WEINTRAUT (Giessen) • CORR-P1-146 • Degradation of nickel-rich layered oxide cathode at high potentials in li-ion batteries > S. Steffen SCHRÖDER (Gießen) • CORR-P1-161 • In-situ investigation of interfacial properties and stability of polymer electrolytes towards Na metal anode with ToF-SIMS and XPS > T. Thomas MEYER (Giessen) • CORR-P1-173 • Characterisation of Aluminium-lithium alloys using NanoSIMS and EPMA > Y. Yizhuo DING (Manchester) • CORR-P1-212 • Toward implementing a new electrochemical cell for in-situ ToF-SIMS analysis of Solid-State Batteries > A. Abdelfettah LALLAOUI • CORR-P1-233 • Ion-beam analysis of calcium fluoride deposited on self-supporting nanoscale aluminum foils > S. Smail DAMACHE (Algiers) • CORR-P1-247 • Dislocation analysis of epitaxial GaN by using SIMS, CL and TEM > M. Marcus WANG (Hsinchu City) • FUN-P1-031 • Development of the imaging mass spectrometry by the addition of oaToFMS to QIT-ToF-SIMS > C. Chang Min CHOI (Cheongju-Si) • FUN-P1-070 • Observation of ripple development on Si surface caused by oblique incident O2+ ion beam over a range of ion parameters > M. Masayuki HATADA (Otsu) • FUN-P1-094 • Secondary emission processes induced by MeV gold nanoparticles > S. Serge DELLA NEGRA (Orsay) • FUN-P1-122 • Energy loss straggling for protons in CaF2 compound in the MeV/amu energy domain > D. Djamel MOUSSA (Algiers) • FUN-P1-133 • Nanoprojectile-SIMS: a zeptomole probe with insight into nanoscale topography > E. Emile SCHWEIKERT • FUN-P1-263 • Investigation of sub-nm binary oxidic surface modifications on mixed ionic electronic conductors with ToF-SIMS: oxidic overlayer stability and ionic interdiffusion behavior > F. Florian FAHRNBERGER (Vienna) • GEO-P1-077 • Analytical procedure for the isotopic measurement of uranium at particle scale by LG-SIMS > M. Manon CORNATON (Arpajon) • GEO-P1-236 • Novel approach to enhance organic acid adsorption on rock surfaces > K. Kion NORRMAN (Dhahran) • HIRES-P1-059 • High-lateral resolution and precise chemical information – Combination of HIM-SIMS and Hybrid-SIMS for interfacial analysis of Composite Polymer Electrolytes > V. Victor BENITO OLMOS (Esch Sur Alzette) • HIRES-P1-225 • Preliminary results of the VAMAS Interlaboratory comparison (TWA 2 A37): OrbiSIMS noise, linearity, and optimisation of secondary ion transmission > G. Gustavo F. Trindade (London) • HIRES-P1-266 • Report of the 101st IUVSTA workshop on high performance SIMS instrumentation and machine learning / artificial intelligence methods for complex data > G. Gustavo Trindade • IND-P1-002 • Using ToF-SIMS and PCA to qualify different foils in a chip picking process > S. Stefan REICHLMAIER (Feldkirchen) • IND-P1-007 • Industrial examples of glass analyses by ToF-SIMS and XPS > J. Julien AMALRIC (Ecully) • IND-P1-172 • Characterization of nanometric multilayered hard coatings by SIMS > J. Jérémy NICLOUT (Esch Sur Alzette) • IND-P1-193 • Metallic 3D-print materials analysed by Secondary Ion Mass Spectrometry > D. Daniel BREITENSTEIN (Münster) • IND-P1-197 • Surface investigation of layer-by-layer grown SurMOFs for energy applications > A. Alessandro AUDITORE (Catania) • IND-P1-273 • Depth Profiling of AlScN and AlYN/GaN Heterostructures using ToF-SIMS > P. Patrik STRANAK (Freiburg) • INST-P1-020 • An innovative SIMS platform with a multi-ion species FIB for high-resolution nano-analytics and ion imaging > P. Peter GNAUCK (Dortmund) • INST-P1-125 • The new CAMECA NanoSIMS-HR > A. Aurélien THOMEN • INST-P1-221 • Correlative FIB / SEM / oToF-SIMS nano-characterization used for Li isotopic tracing in solid state battery field > J. Jean ALMORIC (Fuveau) • ML-P1-014 • Development of a new annotation method for predicting organic molecules in ToF-SIMS spectra using machine learning > T. Tetsuya MASUDA (Tokyo) • ML-P1-157 • Analysis of ToF-SIMS data using correlation analysis > K. Kousuke MORITANI (Himeji)