Poster session 2

• BIO-P2-013 • The evaluation of the permeation of a beauty ingredient derived from a biomolecule to stratum corneum > E. Erika NAKATA (Tokyo) • BIO-P2-019 • Microbial induced corrosion of glass by Paenibacillus polymyxa SCE2 using ToF-SIMS > G. Gabriel PARKER (Chicago) • BIO-P2-080 • In situ matrix enhanced SIMS > A. Arnaud DELCORTE (Louvain-La-Neuve) • BIO-P2-098 • Imaging analysis of plant samples with SIMS and electron microscopy > M. Miyuki TAKEUCHI (Tokyo) • BIO-P2-137 • Plasmon-activated water successfully facilitates re-epithelialization process and wound healing through enhancing epidermal calcium expression: functional anatomical analysis by ToF-SIMS > F-D. Fu-Der MAI (Taipei) • BIO-P2-140 • Utilizing time-of-flight secondary ion mass spectrometry (ToF-SIMS) to analyze localized surface plasmon resonance-activated water enhances the anti-viral and anti-oxidative activities of melatonin > F-D. Fu-Der MAI (Taipei) • BIO-P2-163 • Insights into in vivo topical antibacterial permeation enabled using ToF-SIMS > M. Madeline Berrow (Nottingham) • BIO-P2-170 • Building bioactive enzyme surfaces in vacuo with gas cluster ion beams: from lysozyme (14 kDa) to Glucose Oxidase (80 kDa) > M. Mehdi LAKHDAR (Louvain-La-Neuve) • BIO-P2-178 • Molecular 3D analysis of skin – distribution of topically applied compounds and endogenous components in stratum corneum by ToF-SIMS > P. Peter SJÖVALL (Boras) • BIO-P2-223 • OrbiSIMS spatial lipidomics reveals metabolic changes in the developing brain during environmental stress > Y. Yuhong JIN (London) • BIO-P2-250 • ToF-SIMS and XPS analysis of cholesterol-based nanoparticles for Huntington disease > G. Giacomo CECCONE (Ispra) • COMP-P2-044 • ToF-SIMS in the research of green energy materials > L. Lei ZHANG (Shenyang) • COMP-P2-071 • Etching monitoring of advanced forksheet devices using AKONIS SIMS tool > A-S. Anne-Sophie ROBBES • COMP-P2-081 • Artifacts in multilayer depth profiling: origin and quantification of a double peak layer profile of Ag in ToF-SIMS depth profiles of an Ag/Ni multilayer by MRI model > J. Janez Kovač (Ljubljana) • COMP-P2-093 • Impurity analysis of synthetic diamond for electronics and quantum physics > E. Estelle LOIRE (Versailles) • COMP-P2-127 • Development and surface analysis of 3D-printed titanium alloy composites for implantable medical devices > K. Katja Varda • COMP-P2-135 • Identifying the composition, origin and formation pathways of pollution inducing engine deposits with OrbiSIMS > J. Joel VIGGARS (Nottingham) • COMP-P2-145 • SIMS study of a semiconductor opening switch diode > M-A. Marie-Amandine Pinault-Thaury • COMP-P2-177 • Insights into battery chemistry using ToF-SIMS, XPS, and AES > J. Jacob SCHMIDT • COMP-P2-181 • ToF-SIMS physico-chemical characterization of hybrid organic photovoltaic cells > G. Giuseppe RAGUSANO (Catania) • COMP-P2-222 • Preliminary results from a VAMAS Interlaboratory study to determine sensitivity and repeatability of drug dosed tissue homogenate reference materials > J-L. Jean-Luc VORNG (Teddington) • COMP-P2-226 • Depth profiling of thin metal layers by ToF-SIMS: what about the oxidation state > H. Hervé MONTIGAUD (Aubervilliers) • COMP-P2-258 • SIMS method improvements for non-ideal sample types > J. Jonny Angle • CORR-P2-058 • Multimodal SIMS Imaging of PS-PMMA polymer blend and polymer fragmentation investigation of its homopolymers using light primary ion beam > V. Victor BENITO OLMOS (Esch Sur Alzette) • CORR-P2-106 • Metabolomic and proteomic analysis via OrbiSIMS and LC-MS/MS- reveals molecular alterations of ApoE4 gene carrying H4 neuroglioma cells > L. Li Jennifer Lu (Nottingham) • CORR-P2-155 • Exploring the SIMS matrix effect in high-entropy alloy thin-films > E. Elisabeth JOHN (Berlin) • CORR-P2-167 • Characterization of the surface of cement clinker corn with different methods > F. Faiz Mohamad KAKAR (Siegen) • CORR-P2-183 • Enhancing lithium-ion battery material characterization with FIB-SEM Integrated ToF-SIMS and 3D ToF-SIMS tomography > T. Tomáš Šamořil (Brno) • CORR-P2-216 • Real time monitoring of catalytic oxidation of CO to CO2 over platinum surfaces by SEM & SIMS > P. Petr Bábor (Brno) • CORR-P2-239 • Correlative ToF-SIMS & XPS for the analysis of dopants for organic light-emitting diodes layers > J-P. Jean-Paul BARNES (Grenoble) • CORR-P2-249 • Detection of Lithium traces in microelectronics materials: a preliminary study > V. Vincent Thoréton (Grenoble) • CORR-P2-270 • Deciphering three-dimensional and atomically-dispersed microstructures of ion channels in deep-sea snails > Z. Zhehan YING (Guangzhou) • FUN-P2-032 • Secondary Ion Mass Spectrometry imaging using home-built Ar-GCIB and ToF-SIMS > J. Ji Young BAEK (Cheongju) • FUN-P2-076 • Impact of boron doping on the sputtering dynamics of graphene: a molecular dynamics simulation study > S. Soukaina LOUERDI (Kraków) • FUN-P2-117 • Bond-specific ion-induced fragmentation of biomolecules at high ion energies > M. Michael DÜRR (Giessen) • FUN-P2-131 • Fundamental aspects of nanoparticle SIMS operating in transmission mode > S. Stanislav Verkhoturov (College Station) • FUN-P2-169 • Effects of sample mechanical property on secondary ion yield of organicmolecules in Ar cluster SIMS > K. Kousuke MORITANI (Himeji) • GEO-P2-220 • A ToF-SIMS analytical study of a lithium ore from flotation test products > B. Baian ALMUSNED (London) • GEO-P2-268 • Study of speleothems colours by XPS and ToF-SIMS > A. Alexandre FELTEN (Namur) • HIRES-P2-213 • Cs+ Low temperature ion source: a high-brightness, low-energy-spread ion source for SIMS > B. Brenton KNUFFMAN • HIRES-P2-228 • Light element mapping in metals with High-Resolution SIMS > K. Katie MOORE (Manchester) • IND-P2-005 • Some examples of industrial applications using ToF-SIMS > L. LAURENT DUPUY (Ecully Cedex) • IND-P2-016 • ToF-SIMS analysis to solve a case of molecular contamination in the cleanroom in a new lithography mask zone > J. Julien Lavie (Crolles) • IND-P2-191 • Leveraging SIMS for the understanding of critical mineral and precious metal ores for the mining and mineral processing industries > C. Carolyn HILL-SVEHLA (London) • IND-P2-194 • Combination of SIMS and machine learning as a screening technique in an industrial context > B. Birgit HAGENHOFF (Muenster) • IND-P2-214 • Absolute quantification of alkali metals in diamond-type semiconductors > B. Brahime EL ADIB (Esch Sur Alzette) • IND-P2-274 • Bonding and responding: ToF-SIMS in Sputter Target Manufacturing > R. Robyn GOACHER (Buffalo) • INST-P2-102 • Preliminary study on a pulsed electrospray droplet ion source for Secondary Ion Mass Spectrometry > S. Satoshi NINOMIYA (Kofu) • INST-P2-149 • Combining immunohistochemistry with fast mass spectrometry imaging > M. Mariya SHAMRAEVA (Maastricht) • ML-P2-012 • Quantitative and qualitative analyses of mass spectra of organic electroluminescent (OEL) mixed samples using supervised machine learning > Y. Yuzuki KIUCHI (Tokyo) • ML-P2-154 • Tree based algorithm for ToF-SIMS spectra classification of plastic samples and feature extraction > J. Jin Gyeong SON (Daejeon)